Adding Electron Beam Lithography (EBL) Capability to a Scanning Electron Microscope (SEM)

Author

Department of Electrical Engineering,Sharif University of Technology


Volume 5, Issue 1 - Serial Number 1
Transactions on Computer Science & Engineering and Electrical Engineering (D)
January 1998
  • Receive Date: 10 October 2007
  • Revise Date: 22 December 2024
  • Accept Date: 30 June 1998