Ferdowsi, A. (2003). Universal CMOS Gate for Parallel Test of Logic Circuits. (e2614). Scientia Iranica, 10(4), e2614

Ferdowsi, A. "Universal CMOS Gate for Parallel Test of Logic Circuits" .e2614 , Scientia Iranica, 10, 4, 2003, e2614.

Ferdowsi A. (2003). 'Universal CMOS Gate for Parallel Test of Logic Circuits', Scientia Iranica, 10(4), e2614.

A. Ferdowsi, "Universal CMOS Gate for Parallel Test of Logic Circuits," Scientia Iranica, 10 4 (2003): e2614,

Ferdowsi A. Universal CMOS Gate for Parallel Test of Logic Circuits. Scientia Iranica. 2003;10(4):e2614.